Model/ Parameter

AG-I02

AG-I02A

AG-I02B

AG-I02T

Item Name

Standard Test Finger

Circular Baffle Test Finger

Large Baffle Test Finger

Standard Test Finger With Force

Standard

 IEC 61032 figure 2, IEC60950 figure 2A,IEC60884,IEC60335, UL507ａnd UL1278 figure 8.4.

Application

This probe is intended to verify the basic protection against access to hazardous parts. It is also used to verify the protection against access with a finger.

Test Sample

Easily accessible enclosure live parts or mechanical parts.

Feature

This test finger probe consists of dito、finger、base and insulated handle which simulates the characteristics of the human hand. It has two movable joints, which can be curved at 90°. Customizable: it can be used for anti-electric shock test when equipped with pluggable banana plugs and amphenol connector at the end of the handle , or used for enclosure protection test when open threaded hole of M6 at the end of the handle (connected with pull and push dynamometer).

Joint 1

30±0.2

30±0.2

30±0.2

30±0.2

Joint 2

60±0.2

60±0.2

60±0.2

60±0.2

Finger Length

80±0.2

80±0.2

100±0.2

80±0.2

Fingertip to Baffle

180±0.2

180±0.2

---

180±0.2

Cylindrical

R2±0.05

R2±0.05

R2±0.05

R2±0.05

Spherical

R4±0.05

R4±0.05

R4±0.05

R4±0.05

Fingertip Cutting Bevel Angle

37° ⁰_-10′

37° ⁰_-10′

37° ⁰_-10′

37° ⁰_-10′

Fingertip Taper

14°   ⁰_-10′

14°   ⁰_-10′

14°   ⁰_-10′

14°   ⁰_-10′

Test Finger Diameter

Ф12 ⁰_-0.05

Ф12 ⁰_-0.05

Ф12 ⁰_-0.05

Ф12 ⁰_-0.05

A-A Section Diameter

Ф50

Ф50

---

Ф50

A-A Section Width

20±0.2

---

---

20±0.2

Baffle Diameter

Ф75±0.2

Ф75±0.2

Ф125±0.2

Ф75±0.2

Baffle Thickness

5±0.5

5±0.5

---

5±0.5

Force

---

---

---

10N, 20N, 30N

Applied Standard

IEC61032-1

IEC60335-1

IEC60335-2-14

IEC60529-1