差分探頭 *銷售 TDP0500,P6251,P6250,TDP1000 差分探頭的詳細資料:
深圳市金博宇科技有限公司是專業(yè)從事測試儀器儀表設(shè)備的代理經(jīng)銷售后服務(wù)集成商,并與國內(nèi)外儀表生產(chǎn)廠商有著廣泛的技術(shù)與銷售合作.作為美國菲利爾FLIR、美國FLUKE、美國泰克、美國Keithley 、美國安捷倫Agilent、中國臺灣皇晶ACUTE、英國PEM、普源精電、青島青智、費思泰克,華誼儀表,中國臺灣固緯,德國惠美, 法國CA,中國臺灣品致,長盛儀器,美爾諾,等諸多國內(nèi)外代理與經(jīng)銷:主要銷售的測試儀器儀表有: 示波器、信號源、萬用表、熱像儀、電流電壓探頭、電子負載、電源、頻譜、等測試儀器。。
Outstanding Electrical Performance
- 1 GHz and 500 MHz Probe Bandwidth
- <1 pF Differential Input Capacitance
- 1 MΩ Differential Input Resistance
- ±42 V (DC + pk AC) Differential Input Voltage
- >18 dB CMRR (at 250 MHz 50x attenuation)
- Selectable Bandwidth-limiting Filters
- DC Reject
Versatile DUT Connectivity
- Small Compact Probe Head for Probing Small Geometry Circuit Elements
- Straight Pin, Square Pin, Solder Down, Variable Pitch Standard Accessories
- Robust Design for Reliability
Easy to Use
- Provides Automatic Units Scaling and Readout on the Oscilloscope Display
- TDP1000, TDP0500
- Connect Directly to the DPO7000, DPO4000, and MSO4000 Series Oscilloscopes Using TekVPI™ Probe Interface (No additional power adapters required)
- Easy Access to Scope-displayed Probe Menu for Probe Setup Control and Operating Status Information
- AutoZero – Zeros Out Output Offset
- P6251, P6250
- Connect Directly to TDS5000 and other TekProbe™ Interface Oscilloscopes, or to TekConnect®Oscilloscopes Using TCA-BNC Adapter
Applications
- High-speed Switch Mode Power Supply Design
- CAN/LIN Bus Design
- High-speed Digital Design
- Digital Design and Characterization
- Manufacturing Engineering Test
- Research and Development
The TDP1000, TDP0500, P6251, and P6250 High-voltage Differential Probes provide excellent high-speed electrical and mechanical performance required for today’s Switch Mode Power Supply (SMPS), CAN/LIN Bus, and high-speed digital system designs.
Specifically designed for use with and direct connection to Tektronix oscilloscopes with either the TekVPI™ probe interface, or TekProbe BNC Interface. The TDP1000, TDP0500, P6251, and P6250 High-voltage Differential Probes achieve high-speed signal acquisition and measurement fidelity by solving three traditional measurement challenges:
- Outstanding Electrical Performance
- Versatile Device-Under-Test Connectivity
- Ease of Use