P6248 差分探頭 P6247 泰克差分探頭 P6246 高低壓差分探頭的詳細(xì)資料：
深圳市金博宇科技有限公司是專業(yè)從事測(cè)試儀器儀表設(shè)備的代理經(jīng)銷售后服務(wù)集成商，并與國(guó)內(nèi)外儀表生產(chǎn)廠商有著廣泛的技術(shù)與銷售合作.作為美國(guó)菲利爾FLIR、美國(guó)FLUKE、美國(guó)泰克、美國(guó)Keithley 、美國(guó)安捷倫Agilent、中國(guó)臺(tái)灣皇晶ACUTE、英國(guó)PEM、普源精電、青島青智、費(fèi)思泰克,華誼儀表，中國(guó)臺(tái)灣固緯，德國(guó)惠美,法國(guó)CA，中國(guó)臺(tái)灣品致，長(zhǎng)盛儀器，美爾諾，等諸多國(guó)內(nèi)外代理與經(jīng)銷：主要銷售的測(cè)試儀器儀表有: 示波器、信號(hào)源、萬(wàn)用表、熱像儀、電流電壓探頭、電子負(fù)載、電源、頻譜、等測(cè)試儀器。。
P6248
- 1.7 GHz （Typical Probe Only ≤27 °C） 1X Mode
- 1.5 GHz Bandwidth （Guaranteed）
- 1.85 GHz （Typical Probe Only ≤27 °C） 10X Mode
P6247
- >1.0 GHz Bandwidth （Guaranteed）
P6246
- 400 MHz Bandwidth （Guaranteed）
General
- Low Input Capacitance: <1 pF Differential
- Probe Input Connector: Two Standard 0.025 in./0.63 mm （0.1 in. Center） Square Pin Receptacle （Female）
- Electrostatic Discharge Tolerant （IEC 801-2）
- Connects to TekProbe®BNC Interface on TDS Series Oscilloscopes or Other Instruments using 1103 TekProbe®Power Supply
- For use with Oscilloscopes, Spectrum Analyzers, or Network Analyzers
- >60 dB （1000:1） Common Mode Rejection Ratio （CMRR）
- Small Probe Head Allows Easy Probing of SMDs
Applications
- Communications （Gigabit Ethernet, IEEE-1394, Fibre Channel）
- Semiconductor Characterization （RAMBUS）
- Disk Drive Read Channel Design
- Communication Pulse Shape Compliance
- Jitter, Crosstalk, and BERT Measurements
- Location of Ground Bounce
The P6246, P6247, and P6248 Differential Probes
The P6248, P6247, and P6246 enable users to make time-domain or frequency-domain measurements on high-bandwidth signals commonly found in disk drive, digital IC design （RAMBUS）, and communication applications （Gigabit Ethernet, IEEE-1394 Firewire, and Fibre Channel）. The P6248 includes accessories that allow RAMBUS via probing and IEEE-1394 interconnect access. The small probe head geometry and assorted probe tip accessories allow these probes to easily accommodate manual probing of surface-mount devices while maintaining high CMRR.
The P6246, P6247, and P6248 are ideal for design verification of disk drive read, channel electronics, and timing analysis for troubleshooting ground-bounce problems associated with high-speed logic. They can also be used for pulse shape or crosstalk compliance testing of high-speed communication signals.
