特性和優(yōu)點(diǎn)
出色的電子性能
高探頭帶寬
快速探頭上升時(shí)間
出色的信號(hào)保真度
≤0.8 pF 輸入電容
40 k? 輸入電阻
-4 V 至 +4 V 輸入動(dòng)態(tài)范圍
-10 V 至 +10 VDC 輸入偏置范圍
±30 V（直流 + 峰值交流）輸入電壓（非破壞）
全面的機(jī)械性能
用于探測(cè)小型幾何電路元件的緊湊型探頭頭部
可使用 DUT 附屬附件連接到小至 0.5 毫米針腳的 SMD
強(qiáng)大的可靠性設(shè)計(jì)
易用
直接連接到具有 TekVPI™ 探頭接口的示波器
在示波器畫(huà)面上實(shí)現(xiàn)自動(dòng)單位縮放和讀數(shù)
輕松訪問(wèn)示波器探頭菜單畫(huà)面以了解探頭狀態(tài)/診斷信息和控制探頭直流偏置
通過(guò)示波器實(shí)現(xiàn)遠(yuǎn)程 GPIB/USB 探頭控制
應(yīng)用
高速設(shè)計(jì)的驗(yàn)證、調(diào)試和檢定
信號(hào)完整性、抖動(dòng)和定時(shí)分析
制造工程和測(cè)試
信號(hào)的電壓擺幅高達(dá) 8 Vpk-pk
為應(yīng)用選擇合適的探頭是在測(cè)量中取得信號(hào)保真度的關(guān)鍵。有源探頭為高頻測(cè)量提供了更真實(shí)的信號(hào)復(fù)制和保真度。通過(guò)超低輸入電容和的接口，TAP2500 和 TAP3500 單端有源 FET 探頭提供了當(dāng)今數(shù)字系統(tǒng)設(shè)計(jì)所需要的高速電子和機(jī)械性能。
TAP2500 和 TAP3500 有源 FET 探頭經(jīng)過(guò)專(zhuān)門(mén)設(shè)計(jì)，可使用并直接連接到帶有 TekVPI™ 探頭接口的示波器，通過(guò)解決以下三個(gè)傳統(tǒng)問(wèn)題來(lái)實(shí)現(xiàn)高速信號(hào)采集和測(cè)量保真度：
通過(guò) ≤0.8 pF 輸入電容和 40 k? 輸入阻抗降低 DUT 負(fù)載效應(yīng)
利用多功能 DUT 連接可連接到小型 SMD
在探頭端部為高達(dá) 3.5 GHz 的示波器保留儀器帶寬
Features and benefits
Excellent electronic performance
High probe bandwidth
Fast probe rise time
Excellent signal fidelity
Input capacitance 0.8pf
40 k ? input resistance
-4v to + 4v input dynamic range
-10v to + 10vdc input bias range
Maximum input voltage (non-destructive)
Overall mechanical properties
Compact probe head for detecting small geometric circuit elements
The DUT attachment can be used to connect to SMD pins as small as 0.5 mm
Strong reliability design
Easy to use
Directly connected to a TekVPI ™ oscilloscope probe interface
Realize automatic unit scaling and reading on oscilloscope screen
Easy access to the oscilloscope probe menu screen for probe status/diagnostic information and to control probe dc bias
Remote GPIB/USB probe control is realized through oscilloscope
application
Verification, debugging and verification of high-speed design
Signal integrity, jitter, and timing analysis
Manufacturing engineering and testing
The signal's voltage swing is up to 8 vpk-pk
Selecting the right probe for the application is the key to obtain the best signal fidelity in measurement. Active probe provides more real signal replication and fidelity for high frequency measurement. The TAP2500 and TAP3500 single-ended active FET probes provide the superior high-speed electrical and mechanical properties required for today's digital system designs through ultra-low input capacitors and unique interfaces.
TAP2500 and TAP3500 active FET probe specially designed, can be used and connected directly to the with TekVPI ™ oscilloscope probe interface, by solving the problem of the following three traditional fidelity of high-speed signal acquisition and measurement:
By 0.8 pF input capacitance and 40 k or less loading ? input impedance to reduce the DUT
Connect to a small SMD using a multifunctional DUT connection
The instrument bandwidth is reserved for an oscilloscope up to 3.5ghz at the end of the probe
