TAP1500單端有源場(chǎng)效應(yīng)晶體管探頭為當(dāng)今數(shù)字系統(tǒng)設(shè)計(jì)提供了優(yōu)良的高速電氣和機(jī)械性能。
關(guān)鍵特性
優(yōu)秀的電氣性能
≥1.5 GHz探頭帶寬
<267 ps上升時(shí)間
≤1 pF輸入電容
1 M?輸入電阻
- 8v到+ 8v輸入動(dòng)態(tài)范圍
- 10v到+ 10vdc輸入偏移范圍
通用的力學(xué)性能
用于探測(cè)小型幾何電路元件的小型緊湊探頭
DUT附件可以連接到0.5毫米間距的SMDs
可靠性魯棒設(shè)計(jì)
易于使用的
直接連接到示波器與TekVPI™探頭接口
在示波器顯示上提供自動(dòng)縮放和讀出單元
方便地訪問(wèn)示波器探頭菜單顯示探頭狀態(tài)/診斷信息，并控制探頭直流偏置
通過(guò)示波器遠(yuǎn)程控制GPIB/USB探頭
應(yīng)用程序
高速數(shù)字系統(tǒng)設(shè)計(jì)
組件設(shè)計(jì)及特性
制造工程及測(cè)試
教育研究
電壓波動(dòng)高達(dá)16v的信號(hào)
1.5 GHz有源探頭用于TekVPI™探頭接口
TAP1500有源場(chǎng)效應(yīng)管探頭是專門為使用TekVPI™探頭接口直接連接示波器而設(shè)計(jì)的，它通過(guò)解決三個(gè)傳統(tǒng)問(wèn)題，實(shí)現(xiàn)了高速信號(hào)采集和測(cè)量的保真度:
低DUT加載效果≤1 pF輸入電容和1 M?輸入電阻
多功能DUT連接連接到小的smd
將探頭的儀器帶寬保持為≤1ghz的示波器
TAP1500 Single-ended Active FET Probe provides excellent high-speed electrical and mechanical performance required for today's digital system designs.
Key features
Outstanding electrical performance
≥1.5 GHz probe bandwidth
<267 ps rise time
≤1 pF input capacitance
1 M? input resistance
-8 V to +8 V input dynamic range
-10 V to +10 VDC input offset range
Versatile mechanical performance
Small compact probe head for probing small geometry circuit elements
DUT attachment accessories enable connection to SMDs as small as 0.5 mm pitch
Robust design for reliability
Easy to use
Connects directly to oscilloscopes with the TekVPI™ probe interface
Provides automatic units scaling and readout on the oscilloscope display
Easy access to oscilloscope probe menu display for probe status/diagnostic information, and to control probe DC offset
Remote GPIB/USB probe control through the oscilloscope
Applications
High-speed Digital Systems Design
Component Design and Characterization
Manufacturing Engineering and Test
Educational Research
Signals with Voltage Swings up to 16 V
1.5 GHz active probes for TekVPI™ probe interface
Specifically designed for use and direct connection to oscilloscopes with the TekVPI™ probe interface, the TAP1500 Active FET probe achieves high-speed signal acquisition and measurement fidelity by solving three traditional problems:
Lower DUT loading effects with ≤1 pF input capacitance and 1 M? input resistance
Versatile DUT connectivity for attaching to small SMDs
Preserves instrument bandwidth at the probe tip for ≤1 GHz oscilloscopes
