主要特性和功能
- 9 kHz 至 4.5/6.5/8.5/14/20 GHz
- 2 或 4 端口,50 Ω,S 參數(shù)測試儀
- 提供 130 dB 寬廣的動態(tài)范圍、8 ms 快速測量速度和 0.005 dB/℃ 溫度穩(wěn)定度,可改善測量精度、提高產(chǎn)品良率并增加設(shè)計(jì)裕量
- 增強(qiáng)時(shí)域分析選件可對高速串行互連進(jìn)行全面表征,增強(qiáng)您對設(shè)計(jì)的信心
- 所有選件均可升級,保護(hù)您的投資
Industry-leading 3 year warranty
Every spec verified, adjustments included
頻率 | 20 GHz |
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內(nèi)置端口數(shù)量 | 2 或 4 端口 |
諧波 | -25 dBc |
選件和升級
- 選件
- 保修、校準(zhǔn)和服務(wù)
- 售后升級
選件
了解詳細(xì)信息: 查看配置指南
Additional features | |||
E5071C-010 | 時(shí)域分析 | ||
E5071C-790 | 測量向?qū)е郑∕WA)軟件 | ||
E5071C-008 | 頻率偏置模式 | ||
E5071C-TDR | 增強(qiáng)時(shí)域分析 | ||
Timebase stability | |||
E5071C-UNQ | Standard stability timebase | ||
E5071C-1E5 | High stability timebase | ||
Calibration documentation | |||
E5071C-1A7 | Calibration + Uncertainties + Guardbanding (Not Accredited) | ||
E5071C-A6J | ANSI Z540-1-1994 Calibration | ||
Test set | |||
E5071C-280 | 2-port Test Set, 9 kHz to 8.5 GHz without Bias Tees | ||
E5071C-285 | 2-port Test Set, 100 kHz to 8.5 GHz with Bias Tees | ||
E5071C-480 | 4-port Test Set, 9 kHz to 8.5 GHz without Bias Tees | ||
E5071C-485 | 4-port Test Set, 100 kHz to 8.5 GHz with Bias Tees | ||
E5071C-240 | 2-port Test Set, 9 kHz to 4.5 GHz without Bias Tees | ||
E5071C-245 | 2-port Test Set, 100 kHz to 4.5 GHz with Bias Tees | ||
E5071C-2K5 | 2-port Test Set, 300 kHz to 20 GHz with Bias Tees | ||
E5071C-440 | 4-port Test Set, 9 kHz to 4.5 GHz without Bias Tees | ||
E5071C-4K5 | 4-port Test Set, 300 kHz to 20 GHz with Bias Tees | ||
E5071C-445 | 4-port Test Set, 100 kHz to 4.5 GHz with Bias Tees | ||
E5071C-4D5 | 4-port Test Set, 300 kHz to 14 GHz with Bias Tees | ||
E5071C-465 | 4-port Test Set, 100 kHz to 6.5 GHz with Bias Tees | ||
E5071C-460 | 4-port Test Set, 9 kHz to 6.5 GHz without Bias Tees | ||
E5071C-2D5 | 2-port Test Set, 300 kHz to 14 GHz with Bias Tees | ||
E5071C-265 | 2-port Test Set, 100 kHz to 6.5 GHz with Bias Tees | ||
E5071C-260 | 2-port Test Set, 9 kHz to 6.5 GHz without Bias Tees | ||
Hard disk drive options | |||
E5071C-017 | Removable Data Storage | ||
E5071C-019 | Standard Data Storage | ||
Accessories | |||
E5071C-1CM | Rack mount kit | ||
E5071C-1CN | Front handle kit | ||
E5071C-1CP | Rack mount and front handle kit | ||
E5071C-810 | Add keyboard | ||
E5071C-820 | Add mouse | ||
E5071C-PLG | Continental European power cord - ONLY FOR EU DISTR W MULT PWR CORD STANDARDS | ||
資源中心
查看全部資料: 訪問文檔庫
關(guān)鍵產(chǎn)品信息
查看此產(chǎn)品的詳細(xì)功能。
技術(shù)指標(biāo)
- E5071C ENA Calibration Down to 9 kHz Using the N4431A/B 4-port ECal Modules
- Electronic Calibration (ECal) Modules for Vector Network Analyzers - Technical Overview
- 更多
手冊
- ENA 系列:服務(wù)與支持主頁(手冊,固化軟件)
- 更多
手冊和競爭力概覽
- Keysight E5071C ENA 網(wǎng)絡(luò)分析儀
- [車載以太網(wǎng)]100Base-T1 (BroadR-Reach) PHY 測試、使用實(shí)際波形的調(diào)試,以及認(rèn)證測試
- [Automotive Ethernet] 100Base-T1 PHY Testing, Debugging with Actual Waveforms, and Certification
- 更多
選擇與配置指南
- 是德科技 E5071C 網(wǎng)絡(luò)分析儀
- 是德科技矢量網(wǎng)絡(luò)分析儀
- Accessories Catalog for Impedance Measurements - Catalog
- 更多
演示
- TDR and Return Loss Measurement of Tx and Rx devices under actual operating (2:14)
- 優(yōu)酷-網(wǎng)絡(luò)分析儀
- E5071C ENA Series Network Analyzer Quick Demo Guide
- 更多
支持文檔
探討此產(chǎn)品如何應(yīng)對特定的測量挑戰(zhàn)。
- 應(yīng)用說明
- 解決方案概述
- 文章和案例分析
Simple Scalar Network Analysis of Frequency Converter Devices - Application Note This application note shows the way to make easy scalar network analysis or power measurement using the Keysight U2000 series USB power sensor with the ENA network analyzers. |
是德科技ENA 網(wǎng)絡(luò)分析儀的多端口綜合測量解決方案 是德科技ENA 網(wǎng)絡(luò)分析儀的多端口綜合測量解決方案 |
將您的8753更換為ENA網(wǎng)絡(luò)分析儀的七個(gè)理由 ENA的測試性能比8753ES有相當(dāng)大的提高,表現(xiàn)在動態(tài)范圍、軌跡噪聲等方面,從而使您的測試質(zhì)量大大提高。圖1和圖2顯示出了ENA和8753ES的動態(tài)范圍和軌跡噪聲的明顯對比。。。 |
Keysight Method of Implementation (MOI) for DisplayPort 1.2b Cable-Connector Assembly Compliance Test Using Keysight E5071C ENA Network Analyzer Option TDR |
Keysight Method of Implementation (MOI) for MHL Cable Compliance Tests Using Keysight E5071C ENA Network Analyzer Option TDR |
Drive Down the Cost of Test Using the ENA Series Vector Network Analyzers - Application Note Discussion of the contributions of the Keysight ENA series vector network analyzer to drive down the cost of test in production lines. Including an in depth analysis of the total cost of ownership. |
Time Domain Analysis With a Network Analyzer Application Note (AN 1287-12) This document focuses on time domain analysis (displays) generated from vector network analyzers (VNA). The intent is to provide engineers with frequency domain background, an in-depth view of how a time domain display is created from frequency domain data (S-parameters) and how to apply the time domain display to common problems in RF systems. |
Non-Contact Measurement Method for 13.56 MHz RFID Tags – Application Note For engineers working in RFID antenna design and test, this note discusses a non-contact method for measuring resonant frequencies of RFIDs using a network analyzer. |
Keysight ENA 系列網(wǎng)絡(luò)分析儀E5071C 選件TDR 增強(qiáng)型時(shí)域分析 |
Keysight Method of Implementation (MOI) for MIPI D-PHY Interface S-Parameter and Impedance Conformance Tests Using Keysight E5071C ENA Network Analyzer Option TDR |
Keysight Method of Implementation (MOI) for MIPI M-PHY Interface S-Parameter and Impedance Conformance Tests Using Keysight E5071C ENA Network Analyzer Option TDR |
Effective Reflection Characterization for Active Devices Using ENA Option TDR Application Note This application note describes Hot TDR measurement, which is an effective characterization method for the reflection of transmitter and receiver. |
Impedance and Network Analysis Application List Application Note This document provides the information of unique and new solutions for impedance and network analysis with using Keysight impedance analyzers, LCR meters and ENA series network analyzers. |
Keysight Method of Implementation (MOI) for 100BASE-TX Cable Tests Using Keysight E5071C ENA Option TDR |
Keysight Method of Implementation (MOI) for 10GBASE-KR/40GBASE-KR4 Ethernet Interconnect Tests Using Keysight E5071C ENA Option TDR |
Keysight Method of Implementation (MOI) for 10GBASE-KR/40GBASE-KR4 Ethernet Tx/Rx Return Loss Tests Using Keysight E5071C ENA Option TDR |
Keysight Method of Implementation (MOI) for USB2.0 Cable-Connector Assembly Compliance Test Using Keysight E5071C ENA Network Analyzer Option TDR |
是德科技材料測量: PCB 材料 是德科技材料測量: PCB 材料 |
Materials Measurement: Phantoms - Application Brief This application brief provides the solutions for measuring Phantom materials that are used in wireless and medical industries. |
Keysight Technologies Method of Implementation (MOI) for BroadR-Reach Link Segment Test Using ENA Option TDR |
Method of Implementation (MOI) for HEAC Cable Assembly Test Using Keysight E5071C ENA Network Analyzer Option TDR. |
Keysight Method of Implementation (MOI) for USB3.1 Cable-Connector Assembly Compliance Test Using Keysight E5071C ENA Network Analyzer Option TDR |
Keysight Method of Implementation (MOI) for USB Type-C to Type-C Cable-Connector Assembly Compliance Test Using Keysight E5071C ENA Network Analyzer Option TDR |
Keysight Method of Implementation (MOI) for USB Type-C to Legacy Cable-Connector Assembly Compliance Test Using Keysight E5071C ENA Network Analyzer Option TDR |
Keysight Method of Implementation (MOI) for USB Type-C to Legacy Adapter Assembly Compliance Test Using Keysight E5071C ENA Network Analyzer Option TDR |
E5080A ENA 系列網(wǎng)絡(luò)分析儀 |
Keysight Method of Implementation (MOI) for DisplayPort 1.3 Cable-Connector Assembly Compliance Test Using Keysight E5071C ENA Network Analyzer Option TDR |
Achieving Higher Measurement Accuracy & Better Correlation for PCB Impedance Test - Application Note Traditional method for PCB impedance measurements is difficult to meet accuracy required today. Measurement with full calibration is introduced to meet accuracy for the latest PCB impedance test. |
Keysight Method of Implementation (MOI) for PCIe 3.0 Tx/Rx Impedance and Return Loss Test Using Keysight E5071C ENA Network Analyzer Option TDR |
是德科技利用Keysight ENA 系列網(wǎng)絡(luò)分析儀進(jìn)行無線充電(WPT)測量 是德科技利用Keysight ENA 系列網(wǎng)絡(luò)分析儀進(jìn)行無線充電(WPT)測量 |
Impedance Analyzers and Network Analyzers - Application Note This application note describes the benefits of using USB and LAN interfaces compared to GPIB. The target instruments are bench-top network analyzers, impedance analyzers and LCR meters. |
How to Ensure Interoperability and Compliance of USB Type-C™ Cables and Connectors- Application Note Integrating USB Type-C into products, while ensuring interoperability and compliance, is challenging. This measurement brief covers USB Type-C cable and connector design and test solutions. |
This application note introduces circuit and component characteristics for the WLAN chipset design process using the ENA Series network analyzers. The topics highlighted are balanced measurements, fixture characterizations, and impedance matching. |
This application note describes impedance characteristic evaluation of SMD by using the ENA RF network analyzer with the ICM test fixture. |
使用 ENA 頻率偏置模式進(jìn)行精確的混頻器測量(AN 1463-6) Recommended measurement procedures for evaluating mixers. |
Network Analysis - Advanced Measurements and Modeling of Differential Devices |
是德科技 用于 ENA 的測量向?qū)е?(MWA) 軟件 是德科技 用于 ENA 的測量向?qū)е?(MWA) 軟件 |
MEMS/NEMS Device Measurement Solution Keysight helps you characterize MEMS/NEMS device. |
是德科技 使用網(wǎng)絡(luò)和阻抗分析儀評測 13.56 MHz RFID 標(biāo)簽和 閱讀器/記錄器 是德科技 使用網(wǎng)絡(luò)和阻抗分析儀評測 13.56 MHz RFID 標(biāo)簽和 閱讀器/記錄器 |
Impedance Measurements - Evaluating EMC Components with DC Bias Superimposed This application note gives an overview on how to evaluate electromagnetic compatible (EMC) components in a way that satisfies strict EMC requirements. It also introduces various EMC measurement solutions. |
是德科技使用 20GHz E5071C ENA網(wǎng)絡(luò)分析儀進(jìn)行UWB 天線測量 是德科技使用 20GHz E5071C ENA網(wǎng)絡(luò)分析儀進(jìn)行UWB 天線測量 |
E5071C ENA 射頻網(wǎng)絡(luò)分析儀利用外部開關(guān)提供多端口解決方案應(yīng)用指南 E5071C ENA射頻網(wǎng)絡(luò)分析儀. 圖1顯示了一個(gè)多端網(wǎng)絡(luò)分析解決方案的示例,另外還顯示了 Keysight E5091A 測試儀的內(nèi)部結(jié)構(gòu)圖。 |
是德科技使用 Keysight E5071C ENA 的功能對射頻放大器進(jìn)行測試的技術(shù) 是德科技使用 Keysight E5071C ENA 的功能對射頻放大器進(jìn)行測試的技術(shù) |
In-Fixture Characterization Using the ENA Series RF Network Analyzer with Cascade Microtech... This product note explains a new approach for in-fixture characterization, using the Keysight ENA Series RF network analyzer with Cascade Microtech's probing system. |
在對現(xiàn)代RF電路進(jìn)行評估時(shí),RF工程師通常需要對測量到的S參數(shù)進(jìn)行處理。下面簡要解釋這四類應(yīng)用。是隨著表面安裝器件(SMD)越來越廣泛地采用,它已取代了傳統(tǒng)的同軸接口器件,因此RF元器件的測量普遍 使用了測試夾具。。。 |
This product note discusses how to perform full 4-port error correction using the ENA Series with Cascade Microtech's dual-tip Air Coplanar Probe (ACP). |
支持
查看全部支持資源: 訪問技術(shù)支持
關(guān)鍵支持信息
- 資料庫
- 驅(qū)動程序、固化軟件和軟件
- 部件
- 維修和校準(zhǔn)服務(wù)
- 維護(hù)指南
從其他來源了解到的信息
論壇:發(fā)帖
2020-12-24 02:43 | Programming issue with P5020A |
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2020-12-23 02:04 | How to calibrate VNA with high path loss between VNA port and Cal plane? |
2020-09-18 00:23 | Is Touchstone Version 2.0 format used on the PNA-X |
2020-12-18 08:33 | How can I change the frequency range and save it into state files using VNA e5071b ena |
2020-12-16 09:52 | E5080B Calibration with E-Cal(N4433D) error |
2020-12-07 15:19 | Short standard calibration definition verification |
2020-12-06 14:28 | E5080A/B Changing Display During Calibration |
2020-12-03 09:40 | 8722D Error 61 - restoring learn string and cal arrays |
2020-12-03 07:11 | Noise Figure Measurement |
2020-12-02 00:08 | Using IVIinstrument-AgNA to read S params to matlab |
訪問論壇
常見問題
2020-09-09 | High Speed Digital Interconnects Test Solutions |
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2015-07-27 | 微軟終止支持 Windows XP,對我的 ENA 有何影響? |
2015-03-09 | 如何使用 ENA 執(zhí)行 75 Ω 測量? |
2014-08-11 | When automating markers on the ENA is it possible to programmatically query the indicated inductance or capacitance on a Smith Chart? |
2014-04-28 | 什么是 CPU / 存儲器 / Windows 操作系統(tǒng)的歷史記錄? |
2014-04-27 | ENA 網(wǎng)絡(luò)分析儀系列升級 |
2014-03-27 | ENA 時(shí)域測量的精度是多少? |
2012-12-28 | 能否使用 USB 存儲器來更新 ENA的固化軟件? |
2012-12-28 | 是否提供 ENA 7 系列的逐步測量示例? |
2012-12-20 | Is it possible to programmatically receive the displayed low/high stimulus values when using the "CALC1:MARK:BWID:DATA?" bandwidth query results? |
更多…