E6607C EXT無(wú)線通信測(cè)試儀
E6607C EXT無(wú)線通信測(cè)試儀
E6607C EXT Multiport Wireless Communications Test Set
安捷倫科技公司日前宣布推出新型 E6607C EXT 無(wú)線通信測(cè)試儀。該測(cè)試儀內(nèi)置多端口適配器,可同時(shí)測(cè)試多個(gè)無(wú)線設(shè)備,以實(shí)現(xiàn)經(jīng)濟(jì)高效的大規(guī)模無(wú)線設(shè)備生產(chǎn)測(cè)試。與 EXT-B 相比,EXT-C的測(cè)試速度提升了3倍,但價(jià)格卻降低了 1.3倍。
隨著智能手機(jī)和平板電腦的產(chǎn)量越來(lái)越高,相應(yīng)的測(cè)試方案也需要進(jìn)行調(diào)整,以便適應(yīng)當(dāng)前包含多種功能無(wú)線裝置、制式和頻段的復(fù)雜無(wú)線設(shè)備。Agilent E6607C EXT-C 可提高測(cè)試速率,維持總體測(cè)試設(shè)備的成本效益,同時(shí)又能減少生產(chǎn)線的空間和電能需求,因而是應(yīng)對(duì)上述測(cè)試挑戰(zhàn)的理想選擇。
Agilent E6607C EXT-C 是一款整合式單機(jī)綜合測(cè)試儀,其配置包括矢量信號(hào)分析儀、矢量信號(hào)發(fā)生器、高速序列分析儀和 8個(gè)用于無(wú)線蜂窩制式的雙向輸入/輸出端口以及4個(gè)用于GNSS測(cè)試的輸出端口。
針對(duì)無(wú)線調(diào)制解調(diào)器芯片組中實(shí)施的快速序列非信令測(cè)試模式,*的 EXT-C 序列分析儀可以與調(diào)制解調(diào)器芯片組同步工作,消除信令開(kāi)銷(xiāo),實(shí)現(xiàn)單次采集多次測(cè)量。EXT-C 可對(duì)經(jīng)過(guò)*校準(zhǔn)的多個(gè)被測(cè)器件執(zhí)行測(cè)試,從而幫助制造商更快速地進(jìn)行測(cè)試,并提高生產(chǎn)線的產(chǎn)量。
為了盡量減少測(cè)試流程的變化,并簡(jiǎn)化從研發(fā)到批量生產(chǎn)的過(guò)渡,EXT-C 利用安捷倫信號(hào)分析儀的各項(xiàng)豐富的 X 系列測(cè)量技術(shù),為客戶(hù)提供了專(zhuān)為快速生產(chǎn)制造測(cè)試而設(shè)計(jì)的測(cè)量應(yīng)用軟件。EXT-C 能夠匹配多種 X 系列測(cè)量應(yīng)用軟件,用于蜂窩通信、無(wú)線連通性和數(shù)字音頻/視頻等應(yīng)用。它支持 LTE FDD、LTE TDD、TD-SCDMA 和 2G/3G 等標(biāo)準(zhǔn)。單獨(dú) X 系列測(cè)量應(yīng)用軟件可在最初購(gòu)買(mǎi)儀器時(shí)購(gòu)買(mǎi),也可在購(gòu)買(mǎi)儀器后添加。
EXT-C 的全套軟件工具功能互補(bǔ),可以加快測(cè)試開(kāi)發(fā)。例如,Agilent Signal Studio 可輕松創(chuàng)建非信令控制和測(cè)試信號(hào),以便與 EXT 配合使用。在試生產(chǎn)階段,Agilent Sequence Studio 支持工程師快速創(chuàng)建測(cè)試計(jì)劃并進(jìn)行故障診斷。為了地縮短生產(chǎn)代碼測(cè)試開(kāi)發(fā)的時(shí)間,安捷倫芯片組軟件針對(duì)特定的無(wú)線芯片組調(diào)制解調(diào)器提供了自動(dòng)化校準(zhǔn)和驗(yàn)證功能。
E6607C 在功能方面*向后兼容上一代 E6607B EXT 和 E6617A MPA 組合。為了適應(yīng)未來(lái)生產(chǎn)測(cè)試的需求,EXT-C 提供高達(dá) 3.8 GHz 的全蜂窩頻段范圍(包括 LTE TDD 43 頻段),并支持芯片組要求的快速序列測(cè)試模式。
描述
Transforming manufacturing test
Improve your ROI while getting your next generation cellular devices to market faster
The Agilent Technologies E6607C (EXT-C) wireless communications test set has the capability you need to achieve high throughput test of your complex cellular devices with an effective investment of capital. In today’s competitive environment you cannot afford to pay for idle test equipment resources. With its integrated multiport capability the EXT-C makes optimum use of the integrated VSA/VSG with parallel receiver and fast switched transmitter testing.
The EXT-C is a one-box, non-signaling test set that integrates an innovative test sequencer, vector signal analyzer (VSA), vector signal generator (VSG) and a precision multiport adapter. The EXT-C includes eight bi-directional input/output ports for multi-format cellular testing, and four output ports for GNSS testing. Fast, standards-compliant measurements and modulation analysis capabilities are based on the proven measurement algorithms of the Agilent X-Series signal analyzers.
With the fast and accurate measurements, and flexible sequencer techniques of the E6607B (EXT-B), the EXT-C works to lower your cost of test with a lower cost integrated multi-port solution that provides additional benefits of reduced foot print and reduced power consumption.
主要特性與技術(shù)指標(biāo)
Integrated Multiport Enables Efficient Multi-DUT Test
Integrated multiport provides for parallel receiver test / fast switched transmitter test making effective use of test equipment resources
Lower cost, smaller footprint, lower power consumption verses use of external multiport adapter
Fully compatible with software written for E6607A / E6607B for seamless integration in manufacturing
Add external display, mouse, and keyboard, for full manual control and functionality equivalent to E6607B & MPA
Anticipate your wireless device manufacturing test needs
Benefit from an architecture that is optimized for lower-cost next generation non-signaling test
Add multi-format standards-based calibration and verification test support as needed for LTE TDD/FDD, HSPA+, W-CDMA, 1xEV-DO, cdma2000®, GSM, EDGE-Evo, TD-SCDMA, WiMAXTM, Bluetooth®, GPS/GNSS, and more
Ensure your test system is future proof due to its modern, scalable architecture
Accelerate test development
Ensure seamless transition from NPI to production with proven X-Series analyzer measurements science
Simplify signal creation to synchronize, control, and test your wireless device with Signal Studio software
Streamline test plan creation and troubleshooting in a graphical interface with Sequence Studio software
Reduce time to volume manufacturing with Chipset Software to optimize device calibration and verification
Achieve fast and accurate measurements
Maximize throughput with fast-sequenced, non-signaling test modes for modern chipsets
Speed up your test plan in sequence analyzer mode with single acquisition, multiple measurements
Increase your production yield with superior measurement accuracy
Cost effective integrated Multiport Adapter with metrology grade precision and balancing