The Agilent 71612B Gbit tester is used to measure bit error ratio (BER) and to verify the performance and quality of your components and system hardware. The analyzer operates from 1 to 12Gb/s and will operate down to 100Mb/s with a clock-source extension.
The Agilent 71612B error performance analyzer is available with pattern generator, error detector and integral 12 GHz clock source.
The Agilent 71612B error performance analyzer can be used with optional low-rate clock. For high-performance pattern generation and error analysis across the entire 100 Mb/s to 12 Gb/s range.
The 71612B accurately characterizes Gbit systems and devices such as Lightwave submarine cable systems, SONET/SDH synchronous network transmitters and receivers, Gbit datacom serial links, Lasers and photodetectors, High-speed logic devices, optical amplifiers and Modulators, Decision circuits, Multiplexers and output drivers.
- Exceptional waveform performance (even with reflective or poor terminations).
- Display maybe totally dedicated to pattern editing.
- Error location analysis identifies individual errored bits in custom patterns; measure bit, block or.
- total pattern BER.
- Flexible pattern trigger allows oscilloscope to be triggered on any bit in custom pattern, allowing errored bits to be displayed on oscilloscope.
- Cost effective addition of 12 Gb/s jitter analysis with the Agilent 71501C jitter analyzer.
- Eye line display with Agilent 83480A communications analyzer.
- Q measurement and eye-contour analysis with Agilent E4543A application software.
- Test patterns.
- Zero substitution.
- Variable mark density ratio on patterns.
- STM-64 and STS-192 Samples supplied on disk.
- Measurements.
- Clock frequency.
- Error location analysis.
